| 
 
 TopazReturn to Structure Data INDEX 
 Chen J , Lager G A , Kunz M , Hansen T C , Ulmer P , Acta Crystallographica, Section E , 61 (2005) p.i253-i255, A Rietveld refinement using neutron powder diffraction data of a, fully deuterated topaz, Al2SiO4(OD)2  |